X-ray diffraction (XRD)
This method is used for investigations to determine crystal structures.
Atomic structure characterized
X-ray diffractometry (XRD) uses the ability of X-rays to pass through different materials and the characteristic of being absorbed to a greater or lesser extent, depending on the material, led to the well-known imaging processes in medical technology.
In addition to the transmission phenomenon, the diffraction of the radiation can also be used analytically. X-ray diffraction (XRD) is used to characterize the atomic structure of pure substances and mixtures. The method is mainly used to identify unknown substances and phases (e.g. different phases in thermal spray coatings), to determine the structure of substances and to differentiate between amorphous and crystalline forms of a given solid.
Applications for the determination of:
- Crystal structure analysis
- Texture analysis
- Phase analysis
- Strain and stress condition
- Crystal orientation
- Thin layers
- Lattice parameter